05/12/2017 10:32 am
'Single event upset' testing of the LEON1-FT microprocessor, by exposing a board of LEON chips to a beam of radiation at the Cyclotron Research Centre in Louvain-la-Neuve, Belgium in 2000. Different chips ran in parallel on the same board, with one monitoring the others to detect when an error wasn’t handled. The result showed 99.8% more correction capability.
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