Radiation testing LEON chips

Radiation testing LEON chips

Released

05/12/2017 10:32 am

Copyright

ESA–J. Gaisler

Description

'Single event upset' testing of the LEON1-FT microprocessor, by exposing a board of LEON chips to a beam of radiation at the Cyclotron Research Centre in Louvain-la-Neuve, Belgium in 2000. Different chips ran in parallel on the same board, with one monitoring the others to detect when an error wasn’t handled. The result showed 99.8% more correction capability.

Rate this

  • Currently 5 out of 5 Stars.
  • 1
  • 2
  • 3
  • 4
  • 5
Rating: 5/5 (2 votes cast)

Thank you for rating!

You have already rated this page, you can only rate it once!

Your rating has been changed, thanks for rating!

Views

79